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Test and Design-for-Testability in Mixed-Signal Integrated Circuits formatIsbn:Softcover - 9781441954220 einzelne Vorschläge zur Beseitigung vonTest and Design for Testability in Mixed Signal Integrated Circuits deals with test and design for test of analog and mixed signal integrated circuits. Especially in System on Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and
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